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Atomic force microscopy
Atomic force microscopy
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1. Introduction
The Atomic force microscopy is the specific range of the different imaging approach that is uses for collecting information about the structure at the micro and nano-scale. The laboratory experiment conducts through “Atomic force microscopy” arrangement. In this case, the thin films and nano-structures are uses extensively through the electronic device technologies with the help of high speed computer application to the solid state laser and different types of sensors. That is considerable easy way to understanding the thin film deposition physics and the specific way, in which the nano-structures are developed, therefore it is critical for the advance and modern micro-electronic application. The laboratory experiment will provides the inside into the fundamental mechanism of the film development and formation of the nano-structure. Additionally, there are usage of “Atomic force microscopy”, that is one of the most effective method for scanning the probe microscopy, to image the surfaces of the thin films. These techniques are effective for the high spatial resolution.
2. Procedure
a. Initially, turn-on the power source which passes through the Ebox, once it start, the Green LED light blink and indicate the power is supply.
Figure: 1 EBox control
Figure: 2 LED Illuminator
Figure: 3 Grounding plug
Make sure that ground plug is connected, that is place on the backside of the equipment. Ensure that the ground plug is made from the sliver plug that highlight through the yellow rectangle.
The experimental is start, as the click and open the micron short-cut for the 15 micron scanner. Before the start each day, ensure that there is control through the instrument. Amend this after start the complete experiment. Schillers.et.al.(2017). As moving the z-motor up, it observes that the motor have probe which moves up and away from the test specimen. In case, it won’t move, than turn-off the software and run again.
Removing/Installing Probes:
Following conventional step in order to remove the problem holder from the AFM to place the probe into the probe holder, in case, it requires to replace the probe for specific reason. in this case, it is require to start the z-micrometer in order to manage the knob in clockwise direction and increase the tip through the specific distance away from the sample container to manage the accidental prevention from the define direction when it is require to remove from the tip holder trough specific equipment.
Figure: 4 keep distance between probe holder and sample holder
Ensure that there is considerable large distance between the probe holder and the sample holder; it is difficult to remove the probe holder through pulling and gripping the handle.
Figure: 5 removing the probe holder
It is notice that the probe holder is not placed over the AFM; it will change the alignment over the copper probe clip which faces up. This is considerably place the probe holder down in the clean, open and workspace through the copper probe clip arrangement. Liu.et.al.(2010). It is notice that the probe holder is down in the open segment, the workspace should clean with the copper...