Malicious entities within the whole supply chain can perform attacks through exploiting the scan chains. 1. Testability and security do not contradict each other. 2. Scan-based DFT used by test...

Malicious entities within the whole supply chain can perform attacks through exploiting the scan chains.

1. Testability and security do not contradict each other.

2. Scan-based DFT used by test engineer have no impact on security.

3. Destruction of JTAG after use is developed to improve security and has no impact on testability.

4. The TAP controller is a finite state machine driven by TCK, TMS, and TRST signals.